Title :
NIST optoelectronic measurements for fiber optic applications
Author :
Rochford, K.B. ; Hale, P.D. ; Newbury, N.R.
Author_Institution :
Div. of Optoelectron., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors and instrumentation using electro-optic sampling, and improving wavelength metrology using frequency combs.
Keywords :
electro-optical devices; frequency response; measurement standards; optical fibres; optical variables measurement; optoelectronic devices; NIST optoelectronic measurement; current measurement; electro-optic sampling; fiber optic application; frequency comb; frequency response characterization; temporal characterization; wavelength metrology; Calibration; Current measurement; Measurement standards; Metrology; NIST; Optical attenuators; Optical distortion; Optical fiber polarization; Optical fibers; Stimulated emission;
Conference_Titel :
Optical Fiber Communication Conference, 2005. Technical Digest. OFC/NFOEC
Print_ISBN :
1-55752-783-0
DOI :
10.1109/OFC.2005.192596
