DocumentCode
1820654
Title
Use of 3-D cortical morphometry for mapping increased cortical gyrification and complexity in Williams syndrome
Author
Tosun, D. ; Reiss, A.L. ; Lee, A.D. ; Dutton, R.A. ; Hayashi, K.M. ; Bellugi, U. ; Galaburda, A.M. ; Korenberg, J.R. ; Mills, D.L. ; Toga, A.W. ; Thompson, P.M.
Author_Institution
Dept. of Neurology, UCLA, Los Angeles, CA
fYear
2006
fDate
6-9 April 2006
Firstpage
1172
Lastpage
1175
Abstract
In this paper, we describe the use of three different shape measures i.e., shape index, curvedness, and L2 norm of mean curvature - to quantify cortical gyrification and complexity, thereby evaluating brain structural differences between individuals with Williams syndrome (WS) and healthy controls. Unlike traditional measures of gyrification, the proposed measures analyze the intrinsic geometry of the cortex in three-dimensional (3-D) space. We analyzed the local and global cortical folding patterns of 39 WS and 39 controls using these shape measures, showing increased gyrification in the cingulate, visual cortex, superior parietal lobule, and central sulcus regions (more pronounced in the left brain hemisphere), and increased cortical complexity in left temporal and left parietal lobes in WS. These findings agree with, and extend, previously published studies and may relate to the characteristic clinical and cognitive profiles of individuals with WS
Keywords
biomedical MRI; brain; medical image processing; 3-D cortical morphometry; L2 mean curvature norm; MR imaging; Williams syndrome; brain structural differences; central sulcus regions; cingulate; cortex; cortical complexity; cortical gyrification; curvedness; left brain hemisphere; left parietal lobes; left temporal lobes; shape index; superior parietal lobule; visual cortex; Biomedical imaging; Brain; Geometry; Laboratories; Magnetic resonance imaging; Medical diagnostic imaging; Nervous system; Pattern analysis; Shape control; Shape measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
0-7803-9576-X
Type
conf
DOI
10.1109/ISBI.2006.1625132
Filename
1625132
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