• DocumentCode
    1821037
  • Title

    Functional unit sharing between stacked processors in 3D integrated systems

  • Author

    Borodin, Demid ; Siauw, Winston ; Cotofana, Sorin Dan

  • Author_Institution
    Comput. Eng. Lab., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    18-21 July 2011
  • Firstpage
    311
  • Lastpage
    317
  • Abstract
    The emerging Through Silicon Via (TSV) based 3D integration technology provides the means to stack two or more dies, enabling a low-latency interface between them. Apart of the immediate advantages of such an approach, e.g., short wires, it also opens research avenues for 3D organizations of computation platforms. In this line of reasoning we propose in this paper to share resources between stacked processors while focusing on Functional Units (FUs) inter-die sharing. The purpose of FU sharing is two fold: (i) it enables inexpensive fault tolerance by allowing, when possible, redundant instruction execution on idle FUs of processors located on other stack dies; and (ii) it can result in performance improvements by remotely executing instructions on idle FUs located on other dies in the 3D stack, when more instructions than locally available FUs are issuable. We evaluated the potential implications of our proposal on a 3D system built with two stacked processors (dies). In this case only a limited error detection capability is enabled and the experimental results indicate that our scheme covers on average 46% of the executed instructions. When performance improvement is targeted an average speedup of 6.9% can be achieved for the applications running on the considered two die stack.
  • Keywords
    elemental semiconductors; microprocessor chips; multiprocessing systems; silicon; three-dimensional integrated circuits; 3D integrated systems; Si; dies; functional unit inter-die sharing; low latency interface; stacked processors; through silicon via based 3D integration technology; Benchmark testing; Organizations; Program processors; Reliability; Resource management; Three dimensional displays; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Computer Systems (SAMOS), 2011 International Conference on
  • Conference_Location
    Samos
  • Print_ISBN
    978-1-4577-0802-2
  • Electronic_ISBN
    978-1-4577-0801-5
  • Type

    conf

  • DOI
    10.1109/SAMOS.2011.6045477
  • Filename
    6045477