Title :
Test hardware design challenges in RF testing
Author :
Slamani, Mustapha ; Ding, Han
Author_Institution :
IBM Microelectronics
Keywords :
Circuit testing; Contact resistance; Dynamic range; Hardware; Inductance; Microelectronics; Probes; Production; Radio frequency; Sockets;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011130
