DocumentCode

1821046

Title

Test hardware design challenges in RF testing

Author

Slamani, Mustapha ; Ding, Han

Author_Institution

IBM Microelectronics

fYear

2002

fDate

2002

Firstpage

172

Lastpage

172

Keywords

Circuit testing; Contact resistance; Dynamic range; Hardware; Inductance; Microelectronics; Probes; Production; Radio frequency; Sockets;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Print_ISBN

0-7695-1570-3

Type

conf

DOI

10.1109/VTS.2002.1011130

Filename

1011130