DocumentCode :
1821134
Title :
Analog and mixed signal BIST: too much, too little, too late? [panel session]
Author :
DeWilkins, W. ; Baril, B. ; Osseiran, Afif ; Muradali, F. ; Tabatabaei, S. ; Posse, K.
Author_Institution :
National Semiconductor
fYear :
2002
fDate :
April 28 2002-May 2 2002
Firstpage :
175
Lastpage :
175
Abstract :
Summary form only given, as follows. This is a special interactive panel for discussion between panel members and the audience around the latest analog & mixed signal BIST (built-in self test) techniques. The panel members will give a short introduction of their back rounds and involvements with BIST. The discussion will be opened up to the audience to ask questions, propose new ideas and methods, or to relate their success and failures with Analog BIST, for comment by the panel or other audience members. Topics could include Converter (A/D & D/A), phase-locked loops (PLLs), and high-speed inpu/output (I/O) BIST. Additional topics for discussion could include future analog BIST blocks needed, development & implementation barriers, as well as verification & correlation of the BIST Cores.
Keywords :
Built-in self-test; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011134
Filename :
1011134
Link To Document :
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