DocumentCode
1821134
Title
Analog and mixed signal BIST: too much, too little, too late? [panel session]
Author
DeWilkins, W. ; Baril, B. ; Osseiran, Afif ; Muradali, F. ; Tabatabaei, S. ; Posse, K.
Author_Institution
National Semiconductor
fYear
2002
fDate
April 28 2002-May 2 2002
Firstpage
175
Lastpage
175
Abstract
Summary form only given, as follows. This is a special interactive panel for discussion between panel members and the audience around the latest analog & mixed signal BIST (built-in self test) techniques. The panel members will give a short introduction of their back rounds and involvements with BIST. The discussion will be opened up to the audience to ask questions, propose new ideas and methods, or to relate their success and failures with Analog BIST, for comment by the panel or other audience members. Topics could include Converter (A/D & D/A), phase-locked loops (PLLs), and high-speed inpu/output (I/O) BIST. Additional topics for discussion could include future analog BIST blocks needed, development & implementation barriers, as well as verification & correlation of the BIST Cores.
Keywords
Built-in self-test; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011134
Filename
1011134
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