DocumentCode
1821197
Title
High Speed VSWR Testing with a Novel Six-Port Technique
Author
Goodman, Paul C.
Author_Institution
Microwave Component Division, M/A-COM Omni Spectra, Inc., Merrimack, NH 03054
Volume
2
fYear
1982
fDate
Nov. 1982
Firstpage
89
Lastpage
93
Abstract
This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.
Keywords
Calibration; Data acquisition; Data processing; Detectors; Displays; Frequency; Measurement standards; Oscilloscopes; Reflection; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 20th ARFTG
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1982.323527
Filename
4118919
Link To Document