Title :
Diagnosis of sequence-dependent chips
Author :
Li, James C -M ; McCluskey, E.J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.
Keywords :
CMOS logic circuits; fault diagnosis; fault simulation; integrated circuit testing; logic simulation; logic testing; timing; CMOS gate; Murphy chips; fault simulation; fault-free logic simulation; multiple stuck-at faults; multiple stuck-open faults; sequence-dependent chips; single stuck-open faults; stuck-at faults diagnosis; stuck-open faults diagnosis; timing skew; Books; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Fault detection; Fault diagnosis; Semiconductor device modeling; Timing; Uncertainty;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011137
