DocumentCode
1821288
Title
Verifying real-time properties of MOS-transistor circuits
Author
Frossl, J. ; Kropf, Th
Author_Institution
Inst. fur Rechnerentwurf und Fehlertoleranz, Karlsruhe Univ., Germany
fYear
1995
fDate
6-9 Mar 1995
Firstpage
314
Lastpage
319
Abstract
A verification approach which allows the verification of functional and timing behavior of circuits at transistor level is presented. It is aimed at the verification of asynchronous interfaces and standard-cell library modules. In contrast to other approaches, timing is explicitly considered, allowing one to verify timing-dependent effects with a high degree of accuracy. To conveniently specify desired properties, a specification language based on Linear Quantized Temporal Logic (QLTL) is provided. For an efficient verification, input constraints, necessary for a proper circuit functioning, are converted into input constraining automata, reducing the reachable state space and providing a model linearisation, necessary to prove linear QLTL formulas by branching CTL model checking
Keywords
MOS logic circuits; VLSI; cellular arrays; circuit analysis computing; circuit layout CAD; logic CAD; logic partitioning; specification languages; state-space methods; temporal logic; timing; MOS-transistor circuits; QLTL; VLSI; asynchronous interfaces; branching CTL model checking; functional behavior; input constraining automata; linear quantized temporal logic; model linearisation; reachable state space; real-time properties; specification language; standard-cell library modules; timing behavior; timing-dependent effects; verification approach; Automata; Circuit simulation; Clocks; Law; Legal factors; Libraries; Logic; State-space methods; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-7039-8
Type
conf
DOI
10.1109/EDTC.1995.470378
Filename
470378
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