Title :
Timing jitter measurement of 10 Gbps bit clock signals using frequency division
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Malarsie, Louis ; Ishida, Masahiro ; Musha, Hirobumi
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
Abstract :
This paper presents a new method for measuring timing jitter of the bit clock signal in telecommunication devices operating at 10 Gbps. The method uses a divide-by-M circuit to reduce the frequency and the number of clock samples, and applies the Hilbert transform to measure the timing jitter The theory for this frequency division method is supported by the experimental data from a serializer-deserializer device.
Keywords :
Hilbert transforms; clocks; frequency dividers; phase detectors; phase locked loops; signal sampling; telecommunication equipment testing; timing jitter; 10 Gbit/s; 10 Gbps bit clock signals; Hilbert transform; bit clock generator circuit; clock samples; divide-by-M circuit; frequency division method; high-frequency clocks; phase-frequency detector; phase-locked loop; sampling theory; serializer-deserializer device; telecommunication devices; timing jitter measurement; Circuits; Clocks; Frequency conversion; Frequency measurement; Laboratories; Phase frequency detector; Phase locked loops; Phase measurement; Terminology; Timing jitter;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011140
