• DocumentCode
    1821355
  • Title

    Pediatric cranial defect surface analysis for craniosynostosis postoperation CT images

  • Author

    Teng, Chia-Chi ; Shapiro, Linda G. ; Hopper, Richard A. ; Halen, Jon Ver

  • Author_Institution
    Sch. of Technol., Brigham Young Univ., Provo, UT
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    620
  • Lastpage
    623
  • Abstract
    Craniosynostosis is a congenital disease which consists of premature fusion of one or more cranial sutures, resulting in an abnormal head shape. Patients are usually treated by cranial vault expansion surgery to minimize the potential for brain damage. Full thickness cranial defects result from the expansion surgery, with the size directly proportional to the degree of expansion. The growing cranial skeleton has a unique regenerative capacity to heal small defects; however, when this regenerative capacity is exceeded, the defect is classed as one of critical size and requires surgical treatment to restore protection to the underlying brain. Although what constitutes a critical cranial defect is well known in animal models, it is not as clear for pediatric human skulls. The purpose of this study is to investigate a method that can effectively quantify healing of the pediatric cranial defect surface after cranial vault expansion surgery for craniosynostosis.
  • Keywords
    bone; brain; computerised tomography; medical computing; medical image processing; paediatrics; surgery; brain damage; cranial skeleton; cranial suture premature fusion; cranial vault expansion surgery; craniosynostosis postoperation CT images; full thickness cranial defects; patient healing; pediatric cranial defect surface analysis; Computed tomography; Cranial; Diseases; Head; Image analysis; Medical treatment; Shape; Skeleton; Surface treatment; Surgery; Biomedical imaging; Craniofacial;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541072
  • Filename
    4541072