Title :
An industrial environment for high-level fault-tolerant structures insertion and validation
Author :
Berrojo, Luis ; Corno, Fulvio ; Entrena, Luis ; González, Isabel ; Lopez, Celia ; Reorda, Matteo Sonza ; Squillero, Giovanni
Author_Institution :
Alcatel Espacio S.A., Madrid, Spain
Abstract :
When designing a VLSI circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.
Keywords :
VLSI; fault tolerance; hardware description languages; high level synthesis; integrated circuit design; safety-critical software; RT level; VLSI circuits; fault tolerance insertion; fault-injection algorithm; fault-tolerant structures; safety; safety-critical device; transient faults; Aerospace electronics; Automotive engineering; Circuit faults; Circuit testing; Design engineering; Fault tolerance; Hardware design languages; Process design; Safety; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011143