Enhanced testing performance via unbiased test sets

Author

Wang, Li C. ; Mercer, M. Ray ; Williams, Thomas W.

Author_Institution

Texas Univ., Austin, TX, USA

fYear

1995

fDate

6-9 Mar 1995

Firstpage

294

Lastpage

302

Abstract

The test generation task involves two separate questions which are: (1) What should the next test be? and (2) Have enough tests been selected to achieve an acceptable defective part level? Historically, the same fault set (usually the stuck-at-fault set) has been used to answer both questions. When both questions use the same fault set, a statistical bias is introduced to the answer of the second question. In this paper, we propose the use of independent models for answers to the two questions above, and we show, via probabilistic analysis as well as experiments, that the result is a superior test set selection method

Keywords

VLSI; fault diagnosis; fault location; integrated circuit testing; logic testing; probability; production testing; defective part level; independent models; logic circuits; probabilistic analysis; statistical bias; stuck-at-fault set; test generation task; test set selection method; unbiased test sets; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Manufacturing processes; Performance analysis; Performance evaluation; Predictive models; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1995. ED&TC 1995, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-7039-8

Type

conf

DOI

10.1109/EDTC.1995.470381

Filename

470381