• DocumentCode
    1821383
  • Title

    Estimation of shape model parameters for 3D surfaces

  • Author

    Erbou, Soren G H ; Darkner, Sune ; Fripp, Jurgen ; Ourselin, Sebastien ; Ersboll, Bjarne K.

  • Author_Institution
    DTU Inf., Tech. Univ. of Denmark, Lyngby
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    624
  • Lastpage
    627
  • Abstract
    Statistical shape models are widely used as a compact way of representing shape variation. Fitting a shape model to unseen data enables characterizing the data in terms of the model parameters. In this paper a Gauss-Newton optimization scheme is proposed to estimate shape model parameters of 3D surfaces using distance maps, which enables the estimation of model parameters without the requirement of point correspondence. For applications with acquisition limitations such as speed and cost, this formulation enables the fitting of a statistical shape model to arbitrarily sampled data. The method is applied to a database of 3D surfaces from a section of the porcine pelvic bone extracted from 33 CT scans. A leave-one-out validation shows that the parameters of the first 3 modes of the shape model can be predicted with a mean difference within [-0.01,0.02] from the true mean, with a standard deviation less than 0.34.
  • Keywords
    bone; computerised tomography; image registration; medical image processing; optimisation; 3D surfaces; CT scans; Gauss-Newton optimization scheme; Image registration; X-ray tomography; biomedical image processing; distance maps; image shape analysis; optimization methods; porcine pelvic bone; shape model parameter estimation; statistical shape model; Costs; Data mining; Databases; Least squares methods; Newton method; Parameter estimation; Pelvic bones; Recursive estimation; Shape; Surface fitting; Biomedical image processing; Image registration; Image shape analysis; Optimization methods; X-ray tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541073
  • Filename
    4541073