DocumentCode
1821401
Title
An evaluation methodology for binary pattern classification systems
Author
Tsai, Chih-Fong
Author_Institution
Dept. of Inf. Manage., Nat. Central Univ., Jhongli, Taiwan
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
953
Lastpage
956
Abstract
Evaluation of pattern classification systems is the critical and important step in order to understand the system´s performance over a chosen testing dataset. In general, considering cross validation can produce the `optimal´ or `objective´ classification result. As some ground-truth dataset(s) are usually used for simulating the system´s classification performance, this may be somehow difficult to judge the system, which can provide similar performances for future unknown events. That is, when the system facing the real world cases are unlikely to provide as similar classification performances as the simulation results. This paper presents an ARS evaluation framework for binary pattern classification systems to solve the limitation of using the ground-truth dataset during system simulation. It is based on accuracy, reliability, and stability testing strategies. The experimental results based on the bankruptcy prediction case show that the proposed evaluation framework can solve the limitation of using some chosen testing set and allow us to understand more about the system´s classification performances.
Keywords
pattern classification; ARS evaluation framework; bankruptcy prediction case; binary pattern classification systems; evaluation methodology; ground-truth dataset; reliability testing strategy; stability testing strategy; system performance; system simulation; testing dataset; Accuracy; Error analysis; Pattern classification; Reliability; Training; Training data; classification performance; clustering; evaluation; pattern classification;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674217
Filename
5674217
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