• DocumentCode
    1821401
  • Title

    An evaluation methodology for binary pattern classification systems

  • Author

    Tsai, Chih-Fong

  • Author_Institution
    Dept. of Inf. Manage., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    953
  • Lastpage
    956
  • Abstract
    Evaluation of pattern classification systems is the critical and important step in order to understand the system´s performance over a chosen testing dataset. In general, considering cross validation can produce the `optimal´ or `objective´ classification result. As some ground-truth dataset(s) are usually used for simulating the system´s classification performance, this may be somehow difficult to judge the system, which can provide similar performances for future unknown events. That is, when the system facing the real world cases are unlikely to provide as similar classification performances as the simulation results. This paper presents an ARS evaluation framework for binary pattern classification systems to solve the limitation of using the ground-truth dataset during system simulation. It is based on accuracy, reliability, and stability testing strategies. The experimental results based on the bankruptcy prediction case show that the proposed evaluation framework can solve the limitation of using some chosen testing set and allow us to understand more about the system´s classification performances.
  • Keywords
    pattern classification; ARS evaluation framework; bankruptcy prediction case; binary pattern classification systems; evaluation methodology; ground-truth dataset; reliability testing strategy; stability testing strategy; system performance; system simulation; testing dataset; Accuracy; Error analysis; Pattern classification; Reliability; Training; Training data; classification performance; clustering; evaluation; pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674217
  • Filename
    5674217