Title :
Multi-gigaHertz testing challenges and solutions
Author :
Arabi, Karim ; Hilliges, Klaus-Dieter ; Keezer, David ; Tabatabaei, Sassan
Author_Institution :
PMC Sierra, Inc.
fDate :
April 28 2002-May 2 2002
Keywords :
Accuracy; Aggregates; Business; Circuit testing; Clocks; Frequency measurement; Jitter; Laboratories; Sampling methods; Timing;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011149
