DocumentCode

1821504

Title

Multi-gigaHertz testing challenges and solutions

Author

Arabi, Karim ; Hilliges, Klaus-Dieter ; Keezer, David ; Tabatabaei, Sassan

Author_Institution

PMC Sierra, Inc.

fYear

2002

fDate

April 28 2002-May 2 2002

Firstpage

265

Lastpage

265

Keywords

Accuracy; Aggregates; Business; Circuit testing; Clocks; Frequency measurement; Jitter; Laboratories; Sampling methods; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Conference_Location

Monterey, CA, USA

Print_ISBN

0-7695-1570-3

Type

conf

DOI

10.1109/VTS.2002.1011149

Filename

1011149