DocumentCode :
1821584
Title :
Test Results on the New TSZ Calibration Method
Author :
Speciale, Ross A. ; Tzuang, Clive C.
Author_Institution :
TRW Electronic Systems Group, Redondo Beach, California 90278
Volume :
3
fYear :
1983
fDate :
30468
Firstpage :
39
Lastpage :
46
Abstract :
The new ANA calibration method TSZ has been developed and success fully tested by computer simulation . TSZ is a modified version of the well known TSD method and is intended for those practical measurement situations where the insertion of the reference transmission 1ine, of nominal wave-impedance and of finite length, as " Delay " standard, is either physically difficult Of totally impossible. TSZ uses, besides a "Through" (T) and a "Short" (S), two "Impedance Standards" (Z), to be connected in series or in parallel to the measurement 1ine. The results of computer - simulated calibration tests show the rigorous validity of the new method, which equals that of the older TSD.
Keywords :
Calibration; Delay; Length measurement; Measurement standards; Microwave devices; Microwave measurements; Performance evaluation; Q measurement; Semiconductor device measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 21st ARFTG
Conference_Location :
Burlington, MA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1983.323542
Filename :
4118936
Link To Document :
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