DocumentCode
1821588
Title
On the use of Multi-Criteria Decision Aid tools for the efficient design of 3D-Stacked Integrated Circuits: A preliminary study
Author
Doan, N.A.V. ; De Smet, Y. ; Robert, F. ; Milojevic, D.
Author_Institution
BEAMS-EE, Univ. Libre de Bruxelles, Brussels, Belgium
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
957
Lastpage
962
Abstract
In past decades, the electronic industry has been following the Moore´s law to improve the performance of CMOS integrated circuits (IC). However, it will probably be impossible to follow this law in the future due to physical limitations appearing with the miniaturization of the transistors below a certain threshold. In order to overcome this problem, new technologies have emerged, and among them the 3D-Stacked Integrated Circuits (3D-SIC) have been proposed to keep the Moore´s momentum alive. 3D-SICs can bring numerous advantages in the design of future ICs but at the cost of additional design complexity due to their highly combinatorial nature, and requiring the optimization of several conflicting criteria. In this paper, we present a preliminary study of tools that can help the design of 3D-SICs, using multi-criteria analysis. Our study has targeted one of the main issues in the design of 3D-SICs: the floorplanning. This work has shown that the use of Multi-Criteria Decision Aid (MCDA) tools can provide relevant and objective analysis of the problem that may not be feasible with the current design methods. We believe that these promising results will allow designers to overcome the complexity of designing 3D-SICs.
Keywords
CMOS integrated circuits; integrated circuit design; integrated circuit layout; three-dimensional integrated circuits; 3D-stacked integrated circuits; CMOS integrated circuits; Moore´s law; Moore´s momentum; efficient design; electronic industry; floorplanning; multi-criteria decision aid tools; 3D-Stacked Integrated Circuits; Multi-Criteria Decision Aid; Multi-Objective Optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674222
Filename
5674222
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