• DocumentCode
    1821885
  • Title

    DTI registration with exact finite-strain differential

  • Author

    Yeo, B. T Thomas ; Vercauteren, Tom ; Fillard, Pierre ; Pennec, Xavier ; Golland, Polina ; Ayache, Nicholas ; Clatz, Olivier

  • Author_Institution
    CSAIL, MIT, Boston, MA
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    700
  • Lastpage
    703
  • Abstract
    We propose an algorithm for the diffeomorphic registration of diffusion tensor images (DTI). Previous DTI registration algorithms using full tensor information suffer from difficulties in computing the differential of the Finite Strain tensor reorientation strategy. We borrow results from computer vision to derive an analytical gradient of the objective function. By leveraging on the closed-form gradient and the one-parameter subgroups of diffeomorphisms, the resulting registration algorithm is diffeomorphic and fast. Registration of a pair of 128 x 128 x 60 diffusion tensor volumes takes 15 minutes. We contrast the algorithm with a classic alternative that does not take into account the reorientation in the gradient computation. We show with 40 pairwise DTI registrations that using the exact gradient achieves significantly better registration.
  • Keywords
    Jacobian matrices; biomedical MRI; gradient methods; image registration; medical image processing; biomedical image processing; diffeomorphic registration algorithm; diffusion tensor imaging; exact finite-strain differential; exact gradient computation; finite strain tensor reorientation; image registration; Biomedical computing; Biomedical image processing; Capacitive sensors; Computer vision; Deformable models; Diffusion tensor imaging; Interpolation; Jacobian matrices; Registers; Tensile stress; Biomedical image processing; diffusion tensor imaging; image registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541092
  • Filename
    4541092