Title :
Markov Random Fields using complex line process: An application to Bayesian image restoration
Author :
Colonnese, Stefania ; Rinauro, Stefano ; Scarano, Gaetano
Author_Institution :
DIIET, Univ. La Sapienza di Roma, Rome, Italy
Abstract :
The problem of image restoration is considered, where the goal is to recover the original image starting from its blurred and noisy degraded version. A Bayesian restoration procedure is introduced based on modeling the image given the measurements as a Markov Random Fields characterized by spatially variant local priors. A suitable complex valued line process is introduced, generalizing previous literature works, to account for both the intensity and the orientation of image edges. The presence and the orientation of image edges are locally estimated by a computationally efficient filtering stage especially tuned to visually relevant image features, namely a first-order Circular Harmonic Function filter. Simulation results shows the effectiveness of the complex line process in describing local image discontinuities.
Keywords :
Bayes methods; Markov processes; edge detection; feature extraction; filtering theory; image restoration; random processes; Bayesian image restoration; Markov random fields; blurred image; complex line process; first-order circular harmonic function filter; image edge estimation; image edge intensity; image edge orientation; image filtering; local image discontinuities; noisy degraded version; original image recovery; visually relevant image features; Bayesian methods; Estimation; Image edge detection; Image restoration; Markov random fields; Noise; Simulation; Complex Line process; Gibbs sampling; Image restoration; Markov Random Fields;
Conference_Titel :
Visual Information Processing (EUVIP), 2011 3rd European Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4577-0072-9
DOI :
10.1109/EuVIP.2011.6045517