• DocumentCode
    182205
  • Title

    Scandate hollow cathode for ion thruster

  • Author

    Vancil, Bernard ; Schmidt, Volker ; Lorr, John ; Ohlinger, Wayne

  • Author_Institution
    e Beam Inc., Beaverton, OR, USA
  • fYear
    2014
  • fDate
    22-24 April 2014
  • Firstpage
    57
  • Lastpage
    58
  • Abstract
    A hollow cathode was fabricated from scandium oxide-doped one-micron tungsten powder. The prepared powder was pressed into a solid billet and sintered in hydrogen. The sintered billet was electron discharge machined to create the hollow emitter. A unique test vehicle was developed consisting of a central wire as anode, a glass-rodded support structure, and a glass envelope, pumped and baked at 400o C. The cathode was tested in both vacuum and one torr of xenon. The vacuum was maintained with barium getters flashed on the internal surface of the envelope. A capsule containing xenon was enclosed in the vacuum envelope. After vacuum testing, the capsule was broken and cathode emission in a xenon discharge was measured. About 2 amps/cm2 space-charge-limited emission was achieved in vacuum at 945o Cb(W). In xenon, the current was 50 amps (17A/cm2) temperature-limited at 880o Cb(W). By contrast, an all-tungsten emitter of the same geometry required a temperature of 1080o Cb(W) to achieve the same current.
  • Keywords
    cathodes; ion engines; scandium compounds; semiconductor doping; sintering; tungsten; electron discharge machined; glass envelope; glass-rodded support structure; hollow emitter; hydrogen sintered; ion thruster; scandate hollow cathode; scandium oxide-doped one-micron tungsten powder; sintered billet; solid billet; space-charge-limited emission; temperature 400 degC; vacuum envelope; Cathodes; Discharges (electric); Glass; Powders; Tungsten; Vehicles; Xenon; Scandate hollow cathode; ion propulsion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IVEC.2014.6857488
  • Filename
    6857488