DocumentCode :
1822060
Title :
Alignment systems for the PHENIX muon tracking chambers
Author :
Brooks, M.L. ; Lee, D.M. ; Sondheim, W.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Volume :
1
fYear :
1996
fDate :
2-9 Nov 1996
Firstpage :
523
Abstract :
The alignment systems required for the PHENIX muon tracking chamber system will be described. These systems include the system that has been developed to accurately electro-etch cathode strip foils with respect to external fiducial marks to a 25 μm accuracy, as well as the system that is being developed to measure the relative alignment of three stations of chambers spanning 4.5 meters, to an accuracy of 25 μm
Keywords :
muon detection; particle spectrometers; particle track visualisation; position sensitive particle detectors; PHENIX muon tracking chambers; alignment systems; cathode strip foils electro-etching; external fiducial marks; relative alignment; Cathodes; Current measurement; Etching; Fasteners; Magnetic field measurement; Magnetic separation; Mass spectroscopy; Mesons; Position measurement; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
0-7803-3534-1
Type :
conf
DOI :
10.1109/NSSMIC.1996.591049
Filename :
591049
Link To Document :
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