DocumentCode
1822086
Title
Practical solutions for the application of the oscillation-based-test: start-up and on-chip evaluation
Author
Vázquez, Diego ; Huertas, Gloria ; Leger, Gildas ; Rueda, Adoración ; Huertas, José L.
Author_Institution
Instituto de Microelectron., Univ. de Sevilla, Spain
fYear
2002
fDate
2002
Firstpage
433
Lastpage
438
Abstract
This paper presents practical solutions for two of the main topics arising when applying oscillation-based-test: the start-up of the configured oscillator and the on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.
Keywords
analogue integrated circuits; biquadratic filters; built-in self test; integrated circuit testing; oscillators; switched capacitor filters; BIST; DC level measurement counter; SC filter; amplitude measurement counters; analog testing; configured oscillator start-up; embedded building block testing; integrated prototype; mixed-signal ICs; on-chip evaluation; oscillation-based test; programmable biquad; test signals; Built-in self-test; Circuit faults; Circuit testing; Distortion measurement; Frequency measurement; Oscillators; Pins; Prototypes; Robustness; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011176
Filename
1011176
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