• DocumentCode
    1822120
  • Title

    Reliability and Field Aging Time Using Temperature Sensors

  • Author

    Civilini, Massimo

  • Author_Institution
    Cisco Syst. Inc., San Jose, CA, USA
  • fYear
    2010
  • fDate
    18-25 July 2010
  • Firstpage
    210
  • Lastpage
    213
  • Abstract
    In the last few years the IT infrastructure system management has evolved adding features and automating most of the IT operations. Temperature sensor management is now available throughout the entire infrastructure, allowing a direct control of temperature-related parameters at the single endpoint level. This paper presents a deviation from the standard, pre-release definition of reliability, and includes field temperature effects on the failure rate, thus moving from a statistical to a more endpoint-specific definition of reliability. An implementation example of a cumulative reliability factor for data center electronic systems is also presented.
  • Keywords
    reliability; temperature sensors; IT infrastructure system management; data center electronic systems; failure rate; field aging time; field temperature effects; temperature sensors reliability; temperature-related parameters control; Acceleration; Monitoring; Reliability; Temperature distribution; Temperature measurement; Temperature sensors; data center; embedded sensors; reliability; temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensor Technologies and Applications (SENSORCOMM), 2010 Fourth International Conference on
  • Conference_Location
    Venice
  • Print_ISBN
    978-1-4244-7538-4
  • Type

    conf

  • DOI
    10.1109/SENSORCOMM.2010.39
  • Filename
    5558055