DocumentCode
1822120
Title
Reliability and Field Aging Time Using Temperature Sensors
Author
Civilini, Massimo
Author_Institution
Cisco Syst. Inc., San Jose, CA, USA
fYear
2010
fDate
18-25 July 2010
Firstpage
210
Lastpage
213
Abstract
In the last few years the IT infrastructure system management has evolved adding features and automating most of the IT operations. Temperature sensor management is now available throughout the entire infrastructure, allowing a direct control of temperature-related parameters at the single endpoint level. This paper presents a deviation from the standard, pre-release definition of reliability, and includes field temperature effects on the failure rate, thus moving from a statistical to a more endpoint-specific definition of reliability. An implementation example of a cumulative reliability factor for data center electronic systems is also presented.
Keywords
reliability; temperature sensors; IT infrastructure system management; data center electronic systems; failure rate; field aging time; field temperature effects; temperature sensors reliability; temperature-related parameters control; Acceleration; Monitoring; Reliability; Temperature distribution; Temperature measurement; Temperature sensors; data center; embedded sensors; reliability; temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensor Technologies and Applications (SENSORCOMM), 2010 Fourth International Conference on
Conference_Location
Venice
Print_ISBN
978-1-4244-7538-4
Type
conf
DOI
10.1109/SENSORCOMM.2010.39
Filename
5558055
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