• DocumentCode
    1822136
  • Title

    Reducing time to volume and time to market: Is silicon debug and diagnosis the answer?

  • Author

    Ricchetti, Mike ; Muradali, Fidel ; Vermeulen, Bart ; Dervisoglu, Bulent ; Gottlieb, Bob ; Koenemann, Bernd ; Clark, CJ

  • Author_Institution
    Intellitech
  • fYear
    2002
  • fDate
    April 28 2002-May 2 2002
  • Firstpage
    445
  • Lastpage
    445
  • Keywords
    Costs; Design automation; Design engineering; Hardware; Silicon; Testing; Time to market; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7695-1570-3
  • Type

    conf

  • DOI
    10.1109/VTS.2002.1011178
  • Filename
    1011178
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1822136