مرکز منطقه ای اطلاع رساني علوم و فناوري - Reducing time to volume and time to market: Is silicon debug and diagnosis the answer?

DocumentCode :

1822136

Title :

Reducing time to volume and time to market: Is silicon debug and diagnosis the answer?

Author :

Ricchetti, Mike ; Muradali, Fidel ; Vermeulen, Bart ; Dervisoglu, Bulent ; Gottlieb, Bob ; Koenemann, Bernd ; Clark, CJ

Author_Institution :

Intellitech

fYear :

2002

fDate :

April 28 2002-May 2 2002

Firstpage :

445

Lastpage :

445

Keywords :

Costs; Design automation; Design engineering; Hardware; Silicon; Testing; Time to market; Very large scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Conference_Location :

Monterey, CA, USA

Print_ISBN :

0-7695-1570-3

Type :

conf

DOI :

10.1109/VTS.2002.1011178

Filename :

1011178

Link To Document :