DocumentCode :
1822199
Title :
Author index
fYear :
2002
fDate :
2-2 May 2002
Firstpage :
451
Lastpage :
452
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011180
Filename :
1011180
Link To Document :
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