• DocumentCode
    182225
  • Title

    The modeling and simulation of field emission array tips using the gun code algorithm in MICHELLE

  • Author

    Petillo, John J. ; Panagos, Dimitrios N. ; Jensen, Kevin L.

  • Author_Institution
    Leidos Corp., Billerica, MA, USA
  • fYear
    2014
  • fDate
    22-24 April 2014
  • Firstpage
    79
  • Lastpage
    80
  • Abstract
    We report on the incorporation of a model of field emitters (FE) in the MICHELLE Particle-In-Cell (PIC) beam optics code. The FE model is based on a Point Charge Model (PCM) and allows for rapid and analytical representations of tip current, variation, and emission statistics. Its usage enables determining the impact of emission variation on current characteristics and emittance. Rather than cold field emission characterized by the Fowler Nordheim (FN) equation, a General Thermal-Field (GTF) emission model treats warm and hot field emission sources. We discuss convergence characteristics and use of such models in the steady-state gun code algorithm. Specifically, we look at the rate of convergence, ramifications of meshing techniques including unstructured and structured conformal meshes and different field emission tip geometries.
  • Keywords
    codes; convergence; field emission; field emitter arrays; FE model; FN equation; Fowler Nordheim equation; GTF emission model; MICHELLE particle-in-cell beam optics code; PCM; PIC beam optics code; convergence characteristics; emission statistics; emission variation; field emission array tips; field emission sources; field emission tip geometry; general thermal-field emission model; meshing technique ramifications; point charge model; steady-state gun code algorithm; tip current characteristics; Analytical models; Arrays; Convergence; Iron; Mathematical model; Phase change materials; Space charge; Child-Langmuir Equation; Fowler-Nordheim Equation; MICHELLE; Point Charge Model; Richardson Equation; Space Charge; Thermal Field Emission; Transit time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IVEC.2014.6857499
  • Filename
    6857499