Title :
Backscattered electrons from X-ray target
Author :
Thuc Bui ; Hart, D. ; Ives, R. Lawrence
Author_Institution :
Calabazas Creek Res. Inc., Mountain View, CA, USA
Abstract :
X-rays are radiated from a target when an electron beam is accelerated and collides it. When high energy electrons struck a metal target, significant backscattered electrons could be generated and reduce the image sharpness. This paper will describe the Monte Carlo algorithm to analyze backscattered electrons in Beam Optics Analyzer (BOA) and present simulation results of an X-ray tube. The results will be compared with experimental data.
Keywords :
Monte Carlo methods; X-ray production; X-ray tubes; electron backscattering; Monte Carlo algorithm; X-ray target; X-ray tube; backscattered electrons; beam optics analyzer; high energy electrons; image sharpness; metal target; Anodes; Electron beams; Monte Carlo methods; Optical beams; Optics; Scattering; X-ray imaging; BOA; Beth Stopping power; Monte Carlo; Rutherford Scattering; X-ray; backscattered; beam optics; electron beam;
Conference_Titel :
Vacuum Electronics Conference, IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IVEC.2014.6857500
