• DocumentCode
    1822490
  • Title

    A landmark-based nonlinear elasticity model for mouse atlas registration

  • Author

    Lin, T. ; Lee, E.-F. ; Dinov, I. ; Le Guyader, C. ; Thompson, P. ; Toga, A.W. ; Vese, L.A.

  • Author_Institution
    Dept. of Math., California Univ., Los Angeles, CA
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    788
  • Lastpage
    791
  • Abstract
    This paper is devoted to the registration of gene expression data to a neuroanatomical mouse atlas in two dimensions. We use a nonlinear elasticity regularization allowing large deformations, guided by an intensity-based data fidelity term and by landmarks. We overcome the difficulty of minimizing the nonlinear elasticity functional by introducing an additional variable v sime nablau, where u is the displacement. Thus, in the obtained Euler-Lagrange equation, the nonlinearity is no longer in the derivatives of the unknown, u. Experimental results show gene expression data mapped to a mouse atlas for a standard L2 data fidelity term in the presence of landmarks. We also present comparisons with biharmonic regularization. An advantage of the proposed nonlinear elasticity model is that usually no regridding is necessary, while keeping the data term, regularization term and landmark term in a unified minimization approach.
  • Keywords
    biomechanics; elasticity; genetics; image registration; medical image processing; neurophysiology; nonlinear equations; partial differential equations; Euler-Lagrange equation; biharmonic regularization; gene expression data; intensity-based data fidelity; landmark-based nonlinear elasticity model; mouse atlas registration; neuroanatomical mouse atlas; Biomedical imaging; Brain; Diseases; Elasticity; Finite element methods; Gene expression; Image registration; Mathematics; Mice; Spline; gene expression; landmarks; mouse atlas; nonlinear elasticity; registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541114
  • Filename
    4541114