DocumentCode :
1822676
Title :
Microchip cooling module based on FC72 slot jet arrays without cross-flow
Author :
Fabbri, M. ; Wetter, A. ; Mayer, B. ; Brunschwiler, T. ; Michel, B. ; Rothuizen, H. ; Linderman, R. ; Kloter, U.
Author_Institution :
IBM Res. GmbH, Zurich Res. Lab.
fYear :
2006
fDate :
14-16 March 2006
Firstpage :
54
Lastpage :
58
Abstract :
In view of the rapid increase of microchip power densities, thermal management has become considerably more challenging. This work presents the first results of an effort aimed at developing a liquid-based cooling module capable of handling high heat fluxes. Four modules 20 times 20 times 2 mm3 in size, containing as many as 120 planar ("slot") jets and a drainage channel system that prevented any cross-flow effect, were tested using FC72 as test fluid. The jet hydraulic diameters were between 173 and 310 mum, with larger drainage channels, 701 to 955 mum in diameter, located between the inlet jets. A custom-made heater resembling an actual microchip was manufactured from silicon and equipped with temperature sensors. The effects of the flow rate, the inlet liquid temperature, the gap between impinged surface and nozzle plate, and different module geometries are discussed. A maximum of 92 W/cm2 was removed at a junction temperature of 85 degC using a coolant flow of 1.46 l/min and an inlet temperature of 20 degC
Keywords :
chip scale packaging; cooling; elemental semiconductors; jet engines; multichip modules; silicon; temperature sensors; thermal management (packaging); 173 micron; 20 C; 310 micron; 701 to 955 micron; 85 C; FC72 slot jet arrays; Si; coolant flow; cross flow; custom made heater; drainage channel system; flow rate; heat fluxes; impinged surface; inlet jets; inlet liquid temperature; junction temperature; microchip cooling module; module geometries; nozzle plate; temperature sensors; test fluid; Coolants; Cooling; Energy management; Geometry; Hydraulic diameter; Manufacturing; Silicon; System testing; Temperature sensors; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE
Conference_Location :
Dallas, TX
Print_ISBN :
1-4244-0153-4
Type :
conf
DOI :
10.1109/STHERM.2006.1625206
Filename :
1625206
Link To Document :
بازگشت