• DocumentCode
    1822676
  • Title

    Microchip cooling module based on FC72 slot jet arrays without cross-flow

  • Author

    Fabbri, M. ; Wetter, A. ; Mayer, B. ; Brunschwiler, T. ; Michel, B. ; Rothuizen, H. ; Linderman, R. ; Kloter, U.

  • Author_Institution
    IBM Res. GmbH, Zurich Res. Lab.
  • fYear
    2006
  • fDate
    14-16 March 2006
  • Firstpage
    54
  • Lastpage
    58
  • Abstract
    In view of the rapid increase of microchip power densities, thermal management has become considerably more challenging. This work presents the first results of an effort aimed at developing a liquid-based cooling module capable of handling high heat fluxes. Four modules 20 times 20 times 2 mm3 in size, containing as many as 120 planar ("slot") jets and a drainage channel system that prevented any cross-flow effect, were tested using FC72 as test fluid. The jet hydraulic diameters were between 173 and 310 mum, with larger drainage channels, 701 to 955 mum in diameter, located between the inlet jets. A custom-made heater resembling an actual microchip was manufactured from silicon and equipped with temperature sensors. The effects of the flow rate, the inlet liquid temperature, the gap between impinged surface and nozzle plate, and different module geometries are discussed. A maximum of 92 W/cm2 was removed at a junction temperature of 85 degC using a coolant flow of 1.46 l/min and an inlet temperature of 20 degC
  • Keywords
    chip scale packaging; cooling; elemental semiconductors; jet engines; multichip modules; silicon; temperature sensors; thermal management (packaging); 173 micron; 20 C; 310 micron; 701 to 955 micron; 85 C; FC72 slot jet arrays; Si; coolant flow; cross flow; custom made heater; drainage channel system; flow rate; heat fluxes; impinged surface; inlet jets; inlet liquid temperature; junction temperature; microchip cooling module; module geometries; nozzle plate; temperature sensors; test fluid; Coolants; Cooling; Energy management; Geometry; Hydraulic diameter; Manufacturing; Silicon; System testing; Temperature sensors; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    1-4244-0153-4
  • Type

    conf

  • DOI
    10.1109/STHERM.2006.1625206
  • Filename
    1625206