Characterizations of shock-compacted Nd-system superconductor particles

Author

Kezuka, H. ; Kikuchi, M. ; Atoh, T. ; Fukuoka, K. ; Satoh, Y. ; Yoshizawa, S.

Author_Institution

Dept. of Bionics, Tokyo Univ. of Technol., Japan

Volume

2

fYear

2003

fDate

1-5 June 2003

Firstpage

803

Abstract

Shock compaction for Nd-system superconductor particles have been investigated by shock compaction technique. After the shock compaction characterizations of as-shocked and annealed Nd-system superconductor particles are investigated by X-ray diffraction (XRD)-analysis for the measurements of lattice parameters and SQUID magnetometer-measurements for the susceptibility. SEM(scanning electron microscopy)-observations of as-shocked and annealed Nd-system superconductor particles are carried out for the grain growth with growth steps. As a result, the as-shocked specimen showed an oriented crystal structure with the lattice constants of the orthorhombic cell with a=0.5787 nm, b=0.5874 nm and c=1.17462 nm for as-shocked Nd-Ba-Cu-O calculated by XRD just after the shock compaction under 5.7 GPa. From SEM-observations, the surface of the specimens for as-shocked Nd-system superconductor has large grains of 4-10 μm in length partly with large growth-steps caused mainly by heats generated in shock compaction.

Keywords

X-ray diffraction; annealing; compaction; crystal orientation; grain growth; grain size; high-temperature superconductors; lattice constants; magnetic susceptibility; neodymium; particle size; scanning electron microscopy; 5.7 GPa; Nd; SEM; SQUID magnetometer measurements; X-ray diffraction; XRD; annealing; grain growth; grain size; lattice constants; lattice parameters; oriented crystal structure; orthorhombic cell; scanning electron microscopy; shock compacted Nd system; superconductor particles; susceptibility; Annealing; Compaction; Electric shock; Electron microscopy; Lattices; Magnetic susceptibility; Particle measurements; SQUID magnetometers; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on

ISSN

1081-7735

Print_ISBN

0-7803-7725-7

Type

conf

DOI

10.1109/ICPADM.2003.1218540

Filename

1218540