Title :
Robust pattern recognition using non-iteratively learned perceptron
Author_Institution :
Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
Whenever the input training patterns applied to a one layered, hard limited perceptron (OHP) satisfy a certain positive linear independency (PLI) condition, the learning of these standard patterns by the neural network can be done non iteratively in a few algebraic steps and the recognition of the untrained test patterns can reach an “optimal robustness” if a special learning scheme is adopted in the learning mode. We report the theoretical foundation, the analysis (design) of this pattern recognition system, and the experiments we carried out with this novel system. The experimental result shows that the learning of four digitized training patterns is close to real time, and the recognition of the untrained patterns is above 90% correct. The ultra fast learning speed we achieved here is due to the non iterative nature of the novel learning scheme. The high robustness in recognition here is due to the optimal robustness analysis (including a special feature extraction process) we used in the neural network design
Keywords :
feature extraction; learning (artificial intelligence); pattern recognition; perceptrons; digitized training patterns; feature extraction process; input training patterns; neural network design; non iterative nature; non iteratively learned perceptron; novel learning scheme; one layered hard limited perceptron; optimal robustness; optimal robustness analysis; pattern recognition system; positive linear independency; robust pattern recognition; robust recognition; special learning scheme; theoretical foundation; ultra fast learning speed; untrained test patterns; Equations; Feature extraction; Image processing; Image recognition; Learning systems; Neural networks; Pattern analysis; Pattern recognition; Robustness; Testing;
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4053-1
DOI :
10.1109/ICSMC.1997.633205