Title :
The tensor distribution function
Author :
Leow, Alex D. ; Zhu, Siwei ; McMahon, Katie ; De Zubicaray, Greig I. ; Meredith, M. ; Wright, Margie ; Thompson, Paul M.
Author_Institution :
California Univ., Los Angeles, CA
Abstract :
Diffusion weighted magnetic resonance (MR) imaging is a powerful tool that can be employed to study white matter microstructure by examining the 3D displacement profile of water molecules in brain tissue. By applying diffusion-sensitized gradients along a minimum of 6 directions, second-order tensors can be computed to model dominant diffusion processes. However, conventional DTI is not sufficient to resolve crossing fiber tracts. Recently, a number of high- angular resolution schemes with greater than 6 gradient directions have been employed to address this issue. In this paper, we introduce the tensor distribution function (TDF), a probability function defined on the space of symmetric positive definite matrices. Here, fiber crossing is modeled as an ensemble of Gaussian diffusion processes with weights specified by the TDF. Once this optimal TDF is determined, the diffusion orientation distribution function (ODF) can easily be computed by analytic integration of the resulting displacement probability function.
Keywords :
Gaussian processes; biodiffusion; biomedical MRI; brain; neurophysiology; probability; tensors; 3D displacement profile; Gaussian diffusion processes; brain tissue; diffusion orientation distribution function; diffusion weighted magnetic resonance imaging; diffusion-sensitized gradients; fiber crossing; model dominant diffusion processes; probability function; second-order tensors; symmetric positive definite matrices; tensor distribution function; water molecules; white matter microstructure; Brain; Diffusion processes; Diffusion tensor imaging; Distributed computing; Distribution functions; Magnetic resonance; Magnetic resonance imaging; Microstructure; Symmetric matrices; Tensile stress;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
DOI :
10.1109/ISBI.2008.4541133