DocumentCode :
1823022
Title :
An instrument for measuring the thickness of gamma irradiated xenografts
Author :
Jiménez, F. J Ramírez ; Galindo, S.
Volume :
3
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
1485
Abstract :
We present an instrument for measuring the thickness of porcine xenografts used as temporary biological coverings in the treatment of extensive burn injuries. The instrument is based on PIN diode measurements of the attenuation of X-rays through the xenografts. The PIN diodes were developed as a joint project with CINVESTAV, Mexico. The instrument response to different X-ray energies was characterized and the electronic circuitry was optimized for reducing noise at low X-ray energies. The apparatus is accurate and reasonably priced. It substitutes alternate techniques that require to be in contact with the tissues.
Keywords :
X-ray applications; biomedical measurement; p-i-n diodes; skin; thickness measurement; CINVESTAV; Mexico; PIN diode measurements; X-ray attenuation; X-ray energies; electronic circuitry; extensive burn injury treatment; gamma irradiated xenografts; porcine xenograft thickness measurement; temporary biological coverings; tissues; Animals; Attenuation measurement; Circuit noise; Injuries; Instruments; Noise reduction; Pollution measurement; Skin; Thickness measurement; X-rays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352158
Filename :
1352158
Link To Document :
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