Title :
Automatic Telemetry RF Test and Calibration System
Author :
Meeks, Daniel N.
Author_Institution :
Pan Am World Services, Inc.
Keywords :
Automatic testing; Calibration; Electronic equipment testing; Feeds; Noise figure; Preamplifiers; Radio frequency; Switches; System testing; Telemetry;
Conference_Titel :
ARFTG Conference Digest-Fall, 24th ARFTG
Conference_Location :
Columbia, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1984.323598
