Title :
A CDM robust 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction
Author :
Ruth, Scott ; Stockinger, Michael ; Miller, James W. ; Whitney, Vincent ; Kearney, Mark ; Ngo, Sean
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
In this work we present a hybrid 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction in the rail clamp NMOS during CDM. The design is optimized by SPICE simulations and verified by CDM test data of an I/O test ring and a full product.
Keywords :
MOSFET; SPICE; electrostatic discharge; protection; semiconductor device models; CDM test data; I-O test ring; SPICE simulations; active MOS; clamp design methodology; distributed ESD clamp network; hybrid 5V distributed ESD clamp network; lateral NPN conduction; rail clamp NMOS; voltage 5 V; Clamps; Electrostatic discharge; Fingers; Layout; Logic gates; MOS devices; Semiconductor diodes;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
