• DocumentCode
    1823333
  • Title

    Optimal maintenance policies for three-states POMDP with quality measurement errors

  • Author

    AlDurgam, Mohammad M. ; Duffuaa, Salih O.

  • Author_Institution
    KFUPM, Dhahran, Saudi Arabia
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    2239
  • Lastpage
    2243
  • Abstract
    Partially Observed Markov Decision Process (POMDP) has been used to model decision making under uncertainty in several areas. A few areas of application include: manufacturing, healthcare, business and military applications. In the POMDP context, systems are considered as multi-state systems with hidden states. The common thing among all POMDP models is the existence of measurements utilized to infer about the actual hidden state of the system on hand. However, measurements, in general, are not error free. The impact of measurement errors on the POMDP optimal decision polices is formulated and studied for a three-state deteriorating machine with two quality outcomes and possible quality measurement errors. The decision making problem is modeled as a Three-Layers Hidden Markov Decision Process (TLHMDP). The objective function of the POMDP problem is shown to be a piecewise linear convex one. The impact of measurement errors in the POMDP context is demonstrated by numerical example.
  • Keywords
    decision making; hidden Markov models; piecewise linear techniques; POMDP model; POMDP optimal decision policy; decision making problem; multistate system; optimal maintenance policy; partially observed Markov decision process; piecewise linear convex; quality measurement error; three-layers hidden Markov decision process; three-state deteriorating machine; three-states POMDP; Equations; Hidden Markov models; Maintenance engineering; Markov processes; Mathematical model; Measurement errors; Measurement uncertainty; POMDP; TLHMDP; measurement errors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674294
  • Filename
    5674294