• DocumentCode
    1823487
  • Title

    Novel techniques to modulate the holding voltage in high voltage ESD protections

  • Author

    Farbiz, Farzan ; Salman, Akram A. ; Boselli, Gianluca

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    2011
  • fDate
    11-16 Sept. 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Two new techniques are proposed to modulate the holding voltage of diode-isolated drain extended structures with no increase in area, capacitance, or DC leakage. The effectiveness of these techniques is verified using TCAD simulations as well as DC and TLP measurements.
  • Keywords
    MOSFET; electrostatic discharge; DC measurement; TCAD simulations; TLP measurement; diode isolated drain extended structure; high voltage ESD protections; holding voltage modulation; novel techniques; Electrostatic discharge; Resistors; Simulation; Structural rings; Substrates; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
  • Conference_Location
    Anaheim, CA
  • ISSN
    Pending
  • Electronic_ISBN
    Pending
  • Type

    conf

  • Filename
    6045571