Title :
When good trigger circuits go bad: A case history
Author :
Gerdemann, Alex ; Miller, James W. ; Stockinger, Michael ; Herr, Norman ; Dobbin, Allan ; Ricklefs, Reyhan
Author_Institution :
Freescale Semicond. Inc., Austin, TX, USA
Abstract :
A case history is presented of an advanced latched dual time constant ESD transient trigger circuit design. An unexpected failure occurred with this design which interfered with functional operation of the device. Analysis of the failure is presented along with successful circuit fixes and techniques that ensure safe operation of these circuits.
Keywords :
electrostatic discharge; failure analysis; flip-flops; logic design; trigger circuits; case history; failure analysis; latched dual time constant ESD transient; trigger circuit design; Clamps; Electrostatic discharge; Logic gates; MOS devices; Mirrors; Resistors; Trigger circuits;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
