DocumentCode
1823556
Title
Beam-monitors for TESLA based on diamond-strip-detectors
Author
Bol, J. ; Berdermann, E. ; deBoer, W. ; Dierlamm, A. ; Grigoriev, E. ; Hauler, F. ; Jungermann, L.
Author_Institution
Karlsruhe Univ., Germany
Volume
3
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
1566
Abstract
For TESLA it´s foreseen to measure the beam-profile with so called wire-scanners. A thin carbon fibre is moved through the beam and the number of scattered secondary particles is measured in correlation to the position. From that a beam-profile can be calculated as an average over many bunches of the beam. We successfully tested a diamond-detector in a heavy ion-beam with bunches of up to 3·1010O6+-ions and in a beam of 1010 electrons, as planned for TESLA. The dose of 1015e-/cm2 or more by one of the bunches foreseen for TESLA corresponds to the irradiation a vertex-detector receives during 10 years of LHC. With strip-detectors made from diamond the beam-profile can be measured online for single bunches, with more than one array of strips also for more than one direction. If fast electronics are used and bunches are not too short, even a longitudinal profile can be obtained. The results of our measurements will be presented and discussed afterwards.
Keywords
electron accelerators; linear accelerators; particle beam bunching; particle beam diagnostics; position sensitive particle detectors; semiconductor counters; LHC; TESLA beam-monitors; beam-profile; carbon fibre; diamond-detector; diamond-strip-detectors; heavy ion-beam; scattered secondary particles; vertex-detector; wire-scanners; Conducting materials; Cryogenics; Detectors; Electron beams; Large Hadron Collider; Particle beams; Silicon; Spatial resolution; Strips; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352176
Filename
1352176
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