Title :
CDM protection for millimeter-wave circuits
Author :
Thijs, Steven ; Raczkowski, Kuba ; Linten, Dimitri ; Tseng, Jen-Chou ; Chang, Tzu-Heng ; Song, Ming-Hsiang ; Groeseneken, Guido
Author_Institution :
imec, Leuven, Belgium
Abstract :
Providing CDM protection is a major challenge for mm-wave circuits given the stringent performance requirements. In this paper, two mm-wave ESD protection techniques are compared at 60 GHz, with a focus on CDM performance. For the first time, a good correlation with on-wafer VFTLP and packaged CDM tests is demonstrated on mm-wave circuits, with record CDM levels. Inductive ESD protection delivers 1 kV CDM protection without compromising the 60 GHz RF performance.
Keywords :
CMOS analogue integrated circuits; electrostatic discharge; field effect MIMIC; low noise amplifiers; millimetre wave amplifiers; CDM protection; CMOS technology; LNA circuit; frequency 60 GHz; inductive ESD protection; millimeter-wave circuits; mm-wave ESD protection techniques; on-wafer VFTLP; packaged CDM tests; voltage 1 kV; Electrostatic discharge; Inductors; Noise measurement; Radio frequency; Robustness; Stress; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
