DocumentCode :
1823751
Title :
On the sensitivity of COCOMO II software cost estimation model
Author :
Musilek, Petr ; Pedrycz, Witold ; Sun, Nan ; Succi, Giancarlo
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
fYear :
2002
fDate :
2002
Firstpage :
13
Lastpage :
20
Abstract :
Software cost estimation techniques predict the amount of effort required to develop a software system. Cost estimates are needed throughout the software lifecycle to determine feasibility of software projects and to provide for appropriate allocation or reallocation of available resources. To assess the effect of imprecise evaluations, a comprehensive sensitivity analysis was performed on a major cost estimation model, COCOMO II. Results of this analysis are described and explicated in this paper. To reduce risk of drawing biased conclusions, three different methods for sensitivity analysis were employed: the mathematical analysis of the estimating equation, Monte Carlo simulation, and error propagation. The results of the first two methods are very consistent and confirm expected highest sensitivity of the model to the imprecision of the size estimate. Error propagation allows determination of the combined impact of imprecision in multiple inputs and it is therefore most valuable from the practical point of view. The results obtained by this technique also indicate very strong sensitivity to the imprecision in size estimates. A possible way to cope with imprecise information in software cost estimation is also indicated.
Keywords :
error analysis; sensitivity analysis; software cost estimation; software development management; COCOMO II; error propagation; sensitivity analysis; software cost estimation; software development; uncertainty; Computer science; Costs; Electrical capacitance tomography; Performance evaluation; Programming; Resource management; Sensitivity analysis; Software systems; Sun; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Metrics, 2002. Proceedings. Eighth IEEE Symposium on
ISSN :
1530-1435
Print_ISBN :
0-7695-1339-5
Type :
conf
DOI :
10.1109/METRIC.2002.1011321
Filename :
1011321
Link To Document :
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