DocumentCode :
1823784
Title :
Modelling of potential decay experiments. How to interpret the experimental results?
Author :
Mady, F. ; Renoud, R. ; Bigarrré, J. ; Reboul, J.-M. ; Ganachaud, J.-P.
Author_Institution :
Lab. Univ. des Sci. Appliquees de Cherbourg, Univ. of Caen Basse-Normandie, Cherbourg, France
Volume :
3
fYear :
2003
fDate :
1-5 June 2003
Firstpage :
957
Abstract :
Potential decay experiments are considered as an efficient method for studying the transport properties of insulators. The interpretation of their results is nevertheless still delicate. In most cases, the decay is controlled by the transient conduction of the injected charges through the sample. The interpretation in terms of microscopic properties of the material then requires a good knowledge of the connections between the carriers transport process and the macroscopic observable. These connections can be attained by describing theoretically the relaxation of a charged sheet under its own field. We propose such a modelling and give a practical method for the data interpretation. The study is carried out for physical examples of field-dependent mobilities (small polaron hopping transport and Poole-Frenkel effective mobility) and accounts for the trapping-detrapping processes undergone by the mobile carriers (multiple trapping). The influence of traps is tackled through a discrete and an exponentially decaying density of trapping states. It is shown how these various transport processes generate specific features that can be identified on experimental plots. In each case, the quantitative analysis of the measurements can be achieved from the derived observable expressions which are explicit functions of the relevant microscopic parameters.
Keywords :
Poole-Frenkel effect; carrier mobility; charge injection; electron traps; hole traps; hopping conduction; insulators; polarons; Poole-Frenkel effective mobility; carriers transport process; charged sheet; data interpretation; exponentially decaying density; field dependent mobility; injected charge; insulators; microscopic properties; mobile carriers; polaron hopping transport; potential decay experiments; transient conduction; transport properties; trapping-detrapping processes; Character recognition; Conducting materials; Dielectrics and electrical insulation; Electric variables measurement; Electrodes; Electron beams; Microscopy; Permittivity measurement; Sheet materials; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
ISSN :
1081-7735
Print_ISBN :
0-7803-7725-7
Type :
conf
DOI :
10.1109/ICPADM.2003.1218580
Filename :
1218580
Link To Document :
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