DocumentCode

1823835

Title

The Characterization of Load-Dependent Devices

Author

Adamian, Vahe

Author_Institution

Automatic Testing and Networking, Inc., 17 Mason Street, Lexington, MA 02173

Volume

7

fYear

1985

fDate

31199

Firstpage

77

Lastpage

79

Keywords

Automatic testing; Impedance; Instruments; Noise figure; Noise measurement; Performance evaluation; Power measurement; Scattering parameters; Signal analysis; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest-Spring, 25th ARFTG

Conference_Location

St. Louis, MO, USA

Print_ISBN

0-7803-5686-1

Type

conf

DOI

10.1109/ARFTG.1985.323621

Filename

4119024