DocumentCode :
1823835
Title :
The Characterization of Load-Dependent Devices
Author :
Adamian, Vahe
Author_Institution :
Automatic Testing and Networking, Inc., 17 Mason Street, Lexington, MA 02173
Volume :
7
fYear :
1985
fDate :
31199
Firstpage :
77
Lastpage :
79
Keywords :
Automatic testing; Impedance; Instruments; Noise figure; Noise measurement; Performance evaluation; Power measurement; Scattering parameters; Signal analysis; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1985.323621
Filename :
4119024
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1823835
بازگشت