• DocumentCode
    182385
  • Title

    Investigating the physics of simultaneous breakdown events in metamaterials with multi-resonant unit cells

  • Author

    Chien-Hao Liu ; Neher, Joel ; Booske, John H. ; Behdad, Nader

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
  • fYear
    2014
  • fDate
    22-24 April 2014
  • Firstpage
    235
  • Lastpage
    236
  • Abstract
    Under high power illumination, electromagnetic metamaterials and periodic structures experience internal breakdown that alters their frequency responses. It was recently demonstrated that a breakdown discharge created at a given location within the unit cell of a metamaterial mediates the breakdown at other locations within that unit cell or at the neighboring unit cells in spite of the fact that the intensity of the incident field is not high enough to cause breakdown at these other locations under normal situations. In this paper, we investigate the physics behind this phenomenon and examine three candidate mechanisms for these simultaneous breakdown discharges. These include energetic electron transport, ultraviolet (UV) radiation, and vacuum ultraviolet (VUV) radiation. By experimentally examining the unit cell of a metamaterial composed of multiple resonators, we were able to selectively isolate the coupling influence of the candidate mechanisms. It was established that VUV radiation from the initial discharge yields simultaneous breakdown at the other locations of interest.
  • Keywords
    electromagnetic metamaterials; frequency response; high-frequency discharges; periodic structures; electromagnetic metamaterials; electron transport; frequency response; internal breakdown; multiresonant unit cells; periodic structures; simultaneous breakdown discharges; vacuum ultraviolet radiation; Discharges (electric); Fault location; Metamaterials; Periodic structures; Plasmas; metamaterials; microwave breakdown; periodic plasmas; periodic structures; streaming plasma;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IVEC.2014.6857577
  • Filename
    6857577