Title :
The relation between expected life estimation and amount of data
Author_Institution :
T&D Testing Services, KEMA, Arnhem, Netherlands
Abstract :
Small data sets from e.g. limited tests yield (far) too optimistic impressions of product reliability. This paper explains the background and illustrates this effect numerically.
Keywords :
estimation theory; parameter estimation; product liability; reliability theory; statistical analysis; data sets; life estimation; limited tests yield; optimistic impressions; product reliability; Cables; Circuit testing; Decision making; Life estimation; Parameter estimation; Power generation economics; Probability; Statistics; Supply chains; Warranties;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
Print_ISBN :
0-7803-7725-7
DOI :
10.1109/ICPADM.2003.1218584
