• DocumentCode
    1823866
  • Title

    The relation between expected life estimation and amount of data

  • Author

    Ross, R.

  • Author_Institution
    T&D Testing Services, KEMA, Arnhem, Netherlands
  • Volume
    3
  • fYear
    2003
  • fDate
    1-5 June 2003
  • Firstpage
    974
  • Abstract
    Small data sets from e.g. limited tests yield (far) too optimistic impressions of product reliability. This paper explains the background and illustrates this effect numerically.
  • Keywords
    estimation theory; parameter estimation; product liability; reliability theory; statistical analysis; data sets; life estimation; limited tests yield; optimistic impressions; product reliability; Cables; Circuit testing; Decision making; Life estimation; Parameter estimation; Power generation economics; Probability; Statistics; Supply chains; Warranties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
  • ISSN
    1081-7735
  • Print_ISBN
    0-7803-7725-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.2003.1218584
  • Filename
    1218584
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1823866