Title :
Predictive CDM simulation approach based on tester, package and full integrated circuit modeling
Author :
Abessolo-Bidzo, Dolphin ; Smedes, Theo ; Huitsing, Albert Jan
Author_Institution :
NXP Semicond., Nijmegen, Netherlands
Abstract :
The ESD sensitivity of integrated circuits with respect to the CDM is strongly dependent on the IC package, the substrate resistivity and the effectiveness of the ESD protection network. This paper presents a predictive CDM circuit simulation method based on tester, package and full integrated circuit modeling approach.
Keywords :
electrostatic discharge; integrated circuit modelling; sensitivity; ESD protection network; IC package; full integrated circuit modeling; predictive CDM simulation approach; sensitivity; substrate resistivity; Capacitance; Discharges; Electrostatic discharge; Impedance; Integrated circuit modeling; Substrates;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
