Title :
De-Embedded Measurements Using the HP 8510 Microwave Network Analyzer
Author_Institution :
Hewlett-Packard Company, Network Measurements Division, 1400 Fountaingrove Parkway, Santa Rosa, CA 95401
Keywords :
Calibration; Error analysis; Error correction; Fixtures; Frequency measurement; Instruments; Measurement standards; Microwave devices; Microwave measurements; Microwave transistors;
Conference_Titel :
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323625