DocumentCode
1824013
Title
Capturing real world ESD stress with event detector
Author
Jahanzeb, Agha ; Wang, Kankan ; Harrop, Jeff ; Brodsky, Jonathan ; Ban, Toshio ; Ward, Scott ; Schichl, Joe ; Burgess, Keith ; Duvvury, Charvaka
Author_Institution
Texas Instrum., Dallas, TX, USA
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
5
Abstract
This paper presents a study of detecting ESD stresses wirelessly in order to capture real world events. An example of a product field failure and its debug is provided using this technique. Correlation of the waveforms with Charged Device Model (CDM) and Charged Board Event (CBE) tests is also presented.
Keywords
electrostatic discharge; sensors; CBE; CDM; ESD stress; charged board event; charged device model; debug; event detector; product field failure; Antenna measurements; Antennas; Detectors; Discharges; Electrostatic discharge; Production; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045590
Link To Document