Title :
A spatial multivariate process capability index
Author :
Wang, Shaoxi ; Yeh, Arthur B.
Author_Institution :
Coll. of Software & Microelectron., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
Process capability ultimately decides process quality level. Based on analyzing process capability index (PCI), Process capability may be effectively assured. For the multivariate manufacturing processes, tremendous difficulties are often encountered when one attempts to measure the process capability by directly extending the univariate approach. After analyzing the multivariate Cpm method (Chan et al. 1991), the paper presents a spatial multivariate PCI method, which can solve multivariate off-centered case and may provide references for assuring and improving process quality level while achieving overall evaluation of process quality. At last, examples for calculating multivariate PCI are given and the experimental results show that the systematic method presented is effective and actual.
Keywords :
manufacturing processes; process capability analysis; quality control; multivariate manufacturing process; process quality level; spatial multivariate process capability index; Correlation; Equations; Gaussian distribution; Indexes; Manufacturing processes; Mathematical model; Systematics; multivariate; off-center; process; process capability index;
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location :
Macao
Print_ISBN :
978-1-4244-8501-7
Electronic_ISBN :
2157-3611
DOI :
10.1109/IEEM.2010.5674321