Title :
Product specific ESD risk analysis
Author :
Tamminen, Pasi ; Viheriäkoski, Toni
Author_Institution :
NOKIA Corp., Tampere, Finland
Abstract :
Product and process specific ESD failures can be a challenge despite the well implemented EPA. An efficient ESD control program can be built when process specific risks are analysed based on product sensitivity. In this paper a method and case studies are introduced for controlling product specific ESD risks.
Keywords :
electrostatic discharge; failure analysis; risk analysis; sensitivity analysis; EPA; ESD control program; electrostatic protective area; product sensitivity analysis; product specific ESD risk analysis; specific ESD failure analysis; Antennas; Capacitance; Discharges; Electrostatic discharge; Flexible printed circuits; Sensitivity; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
