• DocumentCode
    1824071
  • Title

    Product specific ESD risk analysis

  • Author

    Tamminen, Pasi ; Viheriäkoski, Toni

  • Author_Institution
    NOKIA Corp., Tampere, Finland
  • fYear
    2011
  • fDate
    11-16 Sept. 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Product and process specific ESD failures can be a challenge despite the well implemented EPA. An efficient ESD control program can be built when process specific risks are analysed based on product sensitivity. In this paper a method and case studies are introduced for controlling product specific ESD risks.
  • Keywords
    electrostatic discharge; failure analysis; risk analysis; sensitivity analysis; EPA; ESD control program; electrostatic protective area; product sensitivity analysis; product specific ESD risk analysis; specific ESD failure analysis; Antennas; Capacitance; Discharges; Electrostatic discharge; Flexible printed circuits; Sensitivity; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
  • Conference_Location
    Anaheim, CA
  • ISSN
    Pending
  • Electronic_ISBN
    Pending
  • Type

    conf

  • Filename
    6045591
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1824071